DWDM Parallel Scanning One for Four Test Station
DWDM Parallel Scanning One for Four Test Station
Product Function Introduction
u It supports scanning and PDL testing of different types of DWDM/AWG modules (devices) and 100G Lan WDM devices, with flexible parameter setting, visual interface, and easy operation.
u Support multi-station to perform real-time parallel shared scanning test on adjustable light sources, without interfering with each other, no need to wait in line.
u Automatic calculation of ITU IL, Min IL, Max IL, IL uniformity, Ripple, PDL, CWL (0.5dB, 1dB, 3dB, etc.), the offset between the center wavelength and the ITU wavelength, Bandwidth, Isolation, Crosstalk and other parameters.
u Automatically analyze and calculate the results of various required test parameters, and automatically determine the test results; all quantities are saved in large quantities, and the shipping report is automatically generated.
Schematic diagram of test interface
System Performance Index
Parameter | Index | Unit | ||
Min | Typical | Max | ||
Working Wavelength | 1260 | 1620 | nm | |
Test Index | ITU IL/Min IL/Max IL/PDL/Ripple/TDL/CWL/Bandwidth/Isolation | |||
Uncertainty | ±0.05 (Fiber splicing test) | dB | ||
±0.1 (connector test) | ||||
PDL Uncertainty | ±0.03 | dB | ||
Measuring Mode | TLS scan/single power meter spot test | |||
Single channel scan time | 6-10 | S | ||
Single point PDL pure measurement time | 3-5 | S | ||
Solution configuration
NO. | Name, Specs., Description | Remark |
1 |
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2 |
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3 |
| Repeatability≤0.01dB |
4 |
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5 |
| Custom customized |
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GPIB card，GPIB cable： PCI-GPIB, GPIB-US-HS |
