Product Function Introduction
u Support Bar test, which can be coupled with automatic handshake, scan test automatically after the coupling is completed.
u It supports scanning of different types of CWDM4 (MUX and DEMUX) and 100G Lan WDM devices and full bandwidth PDL testing. The parameter setting is flexible, the interface is visualized, and the operation is very simple.
u Support multi-station to perform real-time parallel shared scanning test of adjustable light source, no interference between stations, no need to queue Waiting (first in the industry, 100% verified and there are many customer success stories, the scanning time of each station is the same, and And applied for a patent).
u Automatic calculation of ITU IL, Min IL, Max IL, IL uniformity, Ripple, PDL, channel bandwidth and center Wavelength (1dB, 3dB, etc.), Isolation, Slope, Crosstalk and other parameters.
u Automatic analysis and calculation of various required test parameter results and automatic determination of test results.
u The invalid parameters are automatically distinguished and identified, so that the invalid data is clear at a glance.
u The system software is compatible with various adjustable light sources (Agilent, santec, uc, etc.) and various power meters with trigger function.
Schematic diagram of test interface
System Performance Index
Parameter | 指标 | 单位 | ||
Min. | Typical | Max. | ||
Working Wavelength | 1260 | 1360 | nm | |
Test Index | IL/RIPPLE/PDL/ADJ/NADJ/CWL/BW/TDL/CROSSTALK | |||
(IL) | ±0.1(连接头测试) | db | ||
Uncertainty | ±0.1 (connector test) | |||
Measurement mode | Adjustable light source + high-speed power meter | |||
Parallel scan time | 5 | S | ||
Testable product type | CWDM4(MUX/DEMUX),LAN-WDM,AWG |