Coupler Integrated Test Station

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Coupler Integrated Test Station

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Product Function Introduction

1. One-time wiring, simultaneous full-bandwidth scan

test and single-point IL, PDL, RL, DIR test,support

high and low temperature test.

2. One for four sharing broadband light source and

OSA spectrum analyzer, saving hardware cost.

3. Compatible with 1X2, 2X2, 1X4 Coupler products

and WDM device testing, automatically test and calculate

IL, WDL, PDL, RL, DIR, UL, TDL and other parameters.

4. Automatically determine the test results; all data is saved

in a large amount through the SQL Server database, and

shipment reports are automatically generated in batches.

Schematic diagram of test interface

image.png

System Performance Index

 


Parameter

Index

Unit

Min

 Typical

Max.

Working Wavelength

1260


1620

nm

Test index

                                                       ITU IL/Min IL/Max IL/WDL/Ripple/TDL, etc.



Uncertainty

±0.05 (Fiber splicing test)

dB

±0.1 (connector test)

Measurement mode


OSW scan


Single channel scan time

6-8(AQ6370,1250~1650nm,步距/step 0.1nm)

s

 

Solution configuration

No.


Name,Specs,Description


Remark

1

 Broadband light source

1250~1650nm

2

  Spectrum analyzer AQ6370, Agilent 86142B, etc.


3

 Optical Switch

1XN

4

  PDL polarization controller: GM8015-C, GT303-5


5

 Power Meter


6

Test system optical path host


7

GPIB card GPIB-USB-HS