Product Function Introduction
1. One-time wiring, simultaneous full-bandwidth scan
test and single-point IL, PDL, RL, DIR test,support
high and low temperature test.
2. One for four sharing broadband light source and
OSA spectrum analyzer, saving hardware cost.
3. Compatible with 1X2, 2X2, 1X4 Coupler products
and WDM device testing, automatically test and calculate
IL, WDL, PDL, RL, DIR, UL, TDL and other parameters.
4. Automatically determine the test results; all data is saved
in a large amount through the SQL Server database, and
shipment reports are automatically generated in batches.
Schematic diagram of test interface
System Performance Index
Parameter | Index | Unit | ||
Min | Typical | Max. | ||
Working Wavelength | 1260 | 1620 | nm | |
Test index | ITU IL/Min IL/Max IL/WDL/Ripple/TDL, etc. | |||
Uncertainty | ±0.05 (Fiber splicing test) | dB | ||
±0.1 (connector test) | ||||
Measurement mode |
| |||
Single channel scan time | 6-8(AQ6370,1250~1650nm,步距/step 0.1nm) | s |
Solution configuration
No. | Name,Specs,Description |
|
1 | Broadband light source | 1250~1650nm |
2 | Spectrum analyzer AQ6370, Agilent 86142B, etc. | |
3 | Optical Switch | 1XN |
4 | PDL polarization controller: GM8015-C, GT303-5 | |
5 | Power Meter | |
6 | Test system optical path host | |
7 | GPIB card: GPIB-USB-HS |