Isolator, Circulator Automatic Test Station
Isolator, Circulator Automatic Test Station
Product Function Introduction
u Automatically test and calculate various parameters such as IL, PDL, RLin, RLout, ISO, CT, WDL, TDL, etc.
u Circulator compatible device and module \ chassis scanning test. Support high and low temperature test, automatic delay control of temperature rise and fall.
u Isolator supports the simultaneous testing of 4 devices, using high and low temperature waiting time to improve test productivity and efficiency.
u Automatically determine various complex grades for product grade selection.
u Automatically determine the test results; all data is saved in a large amount through the SQL Server database, and shipment reports are automatically generated in batches.
Schematic diagram of test interface
System Performance Index
Parameter | Index | Unit | ||
Min | Typical | Max | ||
Working Wavelength | 1260 | 1620 | nm | |
Test Index | IL/PDL/RL/DIR/CT/WDT//TDL,etc. | |||
Uncertainty | ±0.05 (Fiber splicing test) | db | ||
±0.1 (connector test) | ||||
PDL Uncertainty | ±0.03 | db | ||
Measuring Mode | Point light source+ power meter | |||
Single channel scan time | 15 | S | ||
Single point PDL pure measurement time | 3-5 | S | ||
Testable product type | Isolator/Circulator | |||
Solution configuration
NO. | Name, Specs., Description | Remark |
1 | Adjustable light source | 1250~1650nm |
2 | Optical power meter, PDL polarization controller | |
3 | Optical switch: 1X2, 1X4, mechanical test-level optical switch | Repeatability≤0.01dB |
5 | Test system optical path host | Custom made |
6 | Test industrial computer | |
7 | GPIB card，GPIB cable： PCI-GPIB, GPIB-US-HS |
